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4PP-TypeE hidden Single flattening filter for improved

SKU: 98758866017

4.2
USD1396.19 USD1423.19

Pay in 4 interest-free payments of $349.05 Learn more

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Ships within 48 hours · Estimated delivery Jul 26 - Jul 31

Description

Single flattening filter for improved VIS spectral uniformity plus ND#0

8" Si Wafer Reflectance Standard

SiO2-on-High-n-Glass thickness standard

Step-height standard with 4µm

Wavelength range: 190-2200nm

4PP-TypeE hidden Single flattening filter for improved4PP probe with 1. 6mm spacing, 40um tip radius, 200gm. For substrate bulk measurements. For use with Filmetrics R50 R54 4PP measurement systems.

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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